Revolutionary Technology

Picophotonics Technology

Deep dive into the revolutionary technology that enables electron microscopy resolution through AI-driven optical systems.

Technical Architecture

Our system integrates cutting-edge optical physics, materials science, and artificial intelligence to overcome fundamental limitations of conventional microscopy.

Topological Optical Field Generation
Our breakthrough begins with novel 2D devices that manipulate light at the fundamental level. These devices create topological optical fields with phase singularities, enabling unprecedented sensitivity to nanoscale structures.
Patent-pending 2D design633nm laser illuminationPhase singularity controlSub-wavelength confinement
AI-Driven Pattern Analysis
Advanced neural networks process complex diffraction patterns to extract structural information with picometer precision. Our AI system has been trained on four years of experimental data across multiple sample types and imaging conditions.
Deep learning networks4+ years training dataReal-time reconstructionAdaptive optimization
System Performance Specifications
Resolution~20pm (λ/10000)
Wavelength633nm (HeNe laser)
Numerical Aperture0.9 (100x objective)
Processing SpeedReal-time
Sample PreparationLabel-free
EnvironmentAmbient conditions

AI & Machine Learning

Our proprietary artificial intelligence system transforms complex optical data into precise structural measurements and high-resolution images.

Training Process
Comprehensive dataset development and neural network training

Our neural networks are trained on extensive experimental datasets collected over four years of research, encompassing diverse sample types and imaging conditions.

Supervised learning with verified ground truth
Multi-scale feature extraction
Cross-validation across sample types
Continuous model refinement
System Architecture

Microscopy Setup Visualization

Our system builds upon standard optical microscopy components while incorporating breakthrough innovations in optical field manipulation and AI processing.

Key System Components
Laser Source
633nm HeNe, coherent illumination
2D Optical Devices
Topological field generation
AI Processing Unit
Real-time neural network analysis
High-NA Objectives
100x, 0.9NA precision optics

Performance Specifications

Detailed technical specifications demonstrating the superior performance of LightPico technology across multiple measurement modalities.

Resolution Achievements
1D Static Metrologyλ/800

Nanowire width and position measurement

1D Dynamic Metrologyλ/10000

Real-time nanoscale displacement tracking

2D Static Metrologyλ/28 × λ/94

Long-axis and short-axis elliptical measurements

Multiple Object Detectionλ/3.2

Subwavelength nanoparticle identification

AI-Enhanced Imagingλ/10.8

Arbitrary shape continuous imaging

Technical Capabilities
Label-Free Operation

No fluorescent dyes or contrast agents required, preserving sample integrity

Non-Invasive Imaging

Ambient conditions, no vacuum or sample preparation needed

Real-Time Processing

Immediate results with GPU-accelerated AI analysis

Multi-Scale Analysis

From single nanoparticles to complex multi-object systems

Dynamic Tracking

Monitor structural changes and motion in real-time

Cost-Effective Operation

Significantly lower operational costs than electron microscopy

Comparative Analysis

How LightPico technology compares against existing microscopy solutions across key performance metrics.

MetricConventional OpticalSTED/SNOMElectron MicroscopyLightPico
Resolution~300nm~30nm~1nm~20pm
Sample PreparationMinimalLabeling RequiredExtensiveNone
EnvironmentAmbientAmbientVacuumAmbient
Sample DamageNonePhotobleachingDestructiveNone
CostLowMediumHighMedium
SpeedFastMediumMediumReal-time

Patent Portfolio

Our intellectual property portfolio protects the core innovations that enable breakthrough optical microscopy performance.

Novel 2D Optical Devices
Patent Pending 2024
Innovative device design that enables topological optical field generation for enhanced sensitivity and resolution.
Topological light field manipulation
Phase singularity generation
Sub-wavelength optical confinement
AI-Enhanced Imaging Methods
Patent Pending 2024
Machine learning algorithms for arbitrary shape continuous imaging with unprecedented resolution enhancement.
Neural network architectures
Pattern recognition algorithms
Real-time processing methods

Additional patents in development for advanced metrology techniques and system integration

Explore LightPico Technology

Ready to experience the future of microscopy? Contact our technical team to discuss your specific applications or schedule a detailed system demonstration.