Materials Science

Materials Science

Revolutionize materials characterization with picometer-precision analysis of nanomaterials, 2D structures, and advanced composites. LightPico enables non-destructive investigation of material properties at the atomic scale.

Materials Advantages
Atomic-scale structure analysis
Non-destructive characterization
2D material layer counting
Real-time property monitoring

Materials Characterization Challenges

Modern materials science demands atomic-level precision and non-destructive analysis capabilities that challenge conventional characterization methods.

Atomic-Scale Precision

Characterizing nanomaterials and quantum structures requires resolution beyond the capabilities of conventional optical microscopy.

Sample Integrity

Electron microscopy and AFM techniques can alter or damage delicate materials, affecting their intrinsic properties and behavior.

Dynamic Properties

Understanding how materials respond to environmental changes requires real-time monitoring capabilities with high temporal resolution.

Advanced Materials Characterization

LightPico technology enables unprecedented analysis of material structure and properties with picometer precision while preserving sample integrity.

2D Materials Analysis

Precisely count atomic layers in graphene, MoS₂, and other 2D materials. Map thickness variations, defects, and domain boundaries with unprecedented accuracy and without sample damage.

Nanomaterial Characterization

Analyze nanoparticles, quantum dots, and nanotubes with molecular precision. Determine size distributions, surface properties, and aggregation behavior in their native environment.

Composite Materials

Investigate fiber-matrix interfaces, filler distribution, and phase separation in advanced composites. Monitor structural changes during mechanical testing and environmental exposure.

Materials Characterization Capabilities
Spatial Resolution
Feature detection limit
20pm
Atomic-scale precision
Layer Sensitivity
2D material analysis
Single Layer
Monolayer detection
Sample Damage
Material integrity
Zero
Non-destructive
Environmental Control
In-situ studies
Full Range
Temperature, atmosphere

Materials Science Applications

From quantum materials to industrial composites, LightPico enables breakthrough characterization across the full spectrum of materials research.

2D Materials & van der Waals Heterostructures

Precise characterization of graphene, transition metal dichalcogenides, and layered heterostructures for next-generation electronics.

Layer number determination
Strain and defect mapping
Interface quality assessment
Electronic property correlation

Quantum Materials

Investigation of superconductors, topological insulators, and quantum dots with preservation of their delicate quantum properties.

Phase transition monitoring
Surface state characterization
Quantum confinement effects
Coherence length measurements

Nanoparticles & Colloids

Size, shape, and surface analysis of nanoparticles in solution for catalysis, drug delivery, and energy applications.

Size distribution analysis
Surface functionalization
Aggregation kinetics
Stability assessment

Polymer Science

Molecular-level analysis of polymer structure, crystallinity, and degradation mechanisms without sample preparation.

Chain conformation studies
Crystallization dynamics
Degradation monitoring
Additive distribution

Energy Materials

Characterization of battery electrodes, photovoltaic materials, and fuel cell components during operation and cycling.

Electrode interface evolution
Ion transport pathways
Degradation mechanisms
Performance optimization

Biomaterials

Analysis of biocompatible materials, tissue scaffolds, and bio-inspired structures for medical and biotechnology applications.

Surface biocompatibility
Protein adsorption studies
Scaffold porosity analysis
Degradation kinetics

Research Excellence & Innovation

LightPico technology is enabling breakthrough discoveries in materials science through unprecedented characterization capabilities.

100+
Materials Characterized
1nm
Thickness Sensitivity
20pm
Spatial Resolution
Zero
Sample Damage

Published Research

"Sub-wavelength characterization of 2D materials enables precise layer counting and defect mapping in van der Waals heterostructures."

Nanophotonics 12.14 (2023)

Industry Collaboration

"LightPico technology provides the precision needed for quality control in our advanced materials manufacturing processes."

Leading Materials Company

Advance Your Materials Research

Discover how LightPico technology can revolutionize your materials characterization capabilities with picometer precision and zero sample damage.

Trusted by leading materials research institutions worldwide